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Michael T. Postek

Nanoscale Device Characterization Division, National Institute of Standards and Technology

Affiliated withNational Institute of Standards and TechnologyUniversity of South Florida

Research Area

Biography

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JoVE Journal Publications

ArticleTotal : 1
Year
Method Development for Contactless Resonant Cavity Dielectric Spectroscopic Studies of Cellulosic Paper
Publication title
2019

Other Publications

Article
Year

Scanning| PubMed ID: 12166805

2002

Scanning| PubMed ID: 16878784

2006

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada| PubMed ID: 21122194

2011

Scanning| PubMed ID: 21630286

2011

Scanning| PubMed ID: 23427011

2013

Scanning| PubMed ID: 24166540

2014

Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada| PubMed ID: 27452278

2016

Journal of research of the National Institute of Standards and Technology| PubMed ID: 28053482

1993

Journal of research of the National Institute of Standards and Technology| PubMed ID: 28053483

1993

Proceedings of SPIE--the International Society for Optical Engineering| PubMed ID: 28663664

2015

Proceedings of SPIE--the International Society for Optical Engineering| PubMed ID: 28663665

2015

Proceedings of SPIE--the International Society for Optical Engineering| PubMed ID: 29225398

2017

Radiation physics and chemistry (Oxford, England : 1993)| PubMed ID: 29230084

2018

Tappi journal| PubMed ID: 30983693

2018

Proceedings of SPIE--the International Society for Optical Engineering| PubMed ID: 31092964

2018