7:38Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method0 views•2019•Cited by 17•Engineering•Unit 1Takato Asada1, Yoshihito Ichikawa1, Masashi Kato1,2Takato Asada1Yoshihito Ichikawa1Masashi Kato1,21Department of Electrical & Mechanical Engineering, Nagoya Institute of Technology, 2Frontier Research Institute for Material Science, Nagoya Institute of TechnologyDepartment of Electrical & Mechanical Engineering, Nagoya Institute of TechnologyFrontier Research Institute for Material Science, Nagoya Institute of Technology
