<p class="jove_content">A workflow for comprehensive micro-characterization of active optical devices is outlined. It contains structural as well as functional investigations by means of CT, LM and SEM. The method is demonstrated for a white LED which can be still be operated during characterization.</p>

in-depth-analyses-leds-combination-x-ray-computed-tomography-ct-light

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)

Institution - Hamm-Lippstadt University of Applied Sciences

Articles Published in JoVE