Lamella Preparation
Lamella Preparation - Related Videos
07:00
Preparing Lamellae from Vitreous Biological Samples Using a Dual-Beam Scanning Electron Microscope for Cryo-Electron Tomography
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Cited by 8 •
2021
Using focused ion beam milling to produce vitreous on-grid lamellae from plunge frozen biological samples for cryo-electron tomography.
10:54
Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
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Cited by 5 •
2014
Cryo Electron Microscopes, either Scanning (SEM) or Transmission (TEM), are widely used for characterization of biological samples or other materials with a high water content1. A SEM/Focused Ion Beam (FIB) is used to identify features of interest in samples and extract a thin, electron-transparent lamella for transfer to a cryo-TEM.
08:20
Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
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Cited by 17 •
2021
Here, we present a pipeline for 3D-correlative focused ion beam milling on guiding the preparation of cellular samples for cryo-electron tomography. The 3D position of fluorescently tagged proteins of interest is first determined by cryo-fluorescence microscopy, and then targeted for milling. The protocol is suitable for mammalian, yeast, and bacterial cells.
11:35
Constant Pressure-controlled Extrusion Method for the Preparation of Nano-sized Lipid Vesicles
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Cited by 29 •
2012
This protocol describes an extrusion method for preparing lipid vesicles of sub-micron sizes with a high degree of homogeneity. This method uses a pressure-controlled system with controlled nitrogen flow rates for liposome preparation. The lipid preparation1,2, liposome extrusion, and size characterization will be presented herein.
03:00
Preparation of Epoxides
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2023
Overview Epoxides result from alkene oxidation, which can be achieved by a) air, b) peroxy acids, c) hypochlorous acids, and d) halohydrin cyclization. Epoxidation with Peroxy Acids Epoxidation of alkenes via oxidation with peroxy acids involves the conversion of a carbon–carbon double bond to an epoxide using the oxidizing agent meta-chloroperoxybenzoic acid, commonly known as MCPBA. Since the O–O bond of peroxy acids is very weak, the addition of electrophilic oxygen of peroxy acids to...
FAQs
Protection preserves the selected microstructural area while focused ion beam milling removes surrounding material. Without this step, the feature targeted for analysis could be altered or removed during specimen shaping. Maintaining the region of interest improves the connection between the prepared section and the engineering question, such as examining a particular interface, defect, phase, or damaged zone.
The section must become sufficiently thin for electrons to pass through with limited scattering. Excessive thickness can obscure nanoscale features and reduce the clarity of transmission electron microscopy observations, whereas controlled thinning supports high-resolution examination. This relationship makes final thickness a critical preparation condition when the goal is to resolve local structure rather than only inspect the specimen surface.
Lamella Preparation enables localized examination of interfaces, defects, phases, and nanoscale damage that may be difficult to distinguish in a larger specimen. In engineering studies, these observations help connect local structure with processing history and material performance. The approach is therefore useful when a specific microscopic feature must be analyzed within its surrounding material context.
A typical workflow begins by selecting and protecting the region of interest. Material surrounding that area is then milled away, the resulting section is lifted out, attached to a support grid, and thinned until it becomes suitable for electron transmission. Keeping these stages connected preserves the targeted location while converting part of the larger specimen into a microscopy-ready section.
The workflow relies on a focused ion beam system for site-specific milling, a support grid for holding the lifted-out section, and transmission electron microscopy for subsequent high-resolution analysis. Each component serves a different purpose: material removal defines the section, the grid stabilizes it, and the microscope reveals internal nanoscale structure through the electron-transparent area.
This preparation is valuable when engineers need to analyze a localized feature in metals, semiconductors, ceramics, or other advanced materials. It supports studies that relate interfaces, defects, phases, or nanoscale damage to processing and performance. Because the method targets a selected region, it is particularly relevant when bulk-scale observations cannot explain a specific local failure or material behavior.